New Application Note – Optical dispersion modelling of thin layers with multiwavelength MP-SPR

The unique feature of MP-SPR instruments is a possibility to measure complete SPR curve. This feature combined with an opportunity to equip the instrument with up to 4 wavelengths of light makes MP-SPR an exceptional instrument for layer characterization.

Our new Application Note #171 reveals theory and principle of layer characterization using 3 or 4 wavelength data. Better estimation of the optical dispersion constants can be achieved by using more wavelengths. In this Application Note, the measurement and analysis are performed for poly-electrolyte multilayers (PEM).


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