Optical dispersion modelling of thin layers with multiwavelength MP-SPR

Application Note #171

Complete SPR curves before and after PEM layers measured with four wavelengths (670, 785, 850 and 980nm).

Optical dispersion is a characteristic change of refractive index of a material with wavelength. With Multi-Parametric Surface Plasmon Resonance (MP-SPR), the possibility to measure complete SPR curves at more than one wavelength allows assessment of dispersion constants to be measured of thin layers of a non-absorbing material. The more wavelengths are used, the better the estimation of the optical dispersion constants will be possible. Here optical dispersion measurement and analysis are given for poly-electrolyte multilayers (PEM).

Download Application Note in PDF

Recommended instrument for this application


Other articles