Topography effects in AFM force mapping experiments on xylan-decorated cellulose thin films
Xylan-coated cellulose thin films has been investigated by means of atomic force microscopy (AFM) and force mapping experiments. The birch xylan deposition on the film was performed under control by means of a multiple parameter surface plasmon resonance spectroscopy (MP-SPR) under dynamic conditions. The coated films were submitted to AFM in phase imaging mode to force mapping with modified AFM tips (sensitive to hydrophilic OH and hydrophobic CH3 groups) in order to characterize and localize the xylan on the surfaces. At the first glance, a clear difference in the adhesion force between xylan-coated areas and cellulose has been observed. However, these different adhesion forces originate from topography effects, which prevent an unambiguous identification and subsequent localization of the xylan on the cellulosic surfaces.
1 – University of Leoben, Institute for Physics, Franz-Josef-Str. 18, 8700 Leoben, Austria
2 – Graz University of Technology, Institute for Paper, Pulp and Fibre Technology, Innfeldgasse 23, 8010 Graz, Austria
3 – CD-Laboratory for surface chemical and physical fundamentals of paper strength, Petersgasse 16/2, 8010 Graz, Austria
4 – Graz University of Technology, Institute for Chemistry and Technology of Materials, Stremayrgasse 9, 8010 Graz, Austria
5 – Graz University of Technology, Institute for Inorganic Chemistry, Innfeldgasse 23, 8010 Graz, Austria
6 – Graz University of Technology, Institute for Solid State Physics, Petersgasse 16/2, 8010 Graz, Austria
7 – University of Maribor, Institute for the Engineering and Design of Materials, Smetanova Ulica 17, 2000 Maribor, Slovenia