CVD-grown Graphene-on-Au characterization and sensing using Kretschmann-based SPR

A Kretschmann-based surface plasmon resonance (SPR) sensing method was used to determine the refractive index and thickness of graphene thin films. The measured complex refractive index (n,k) values of graphene on Au at 670 nm and 785 nm wavelength are 2.85, 0.74 and 3.1, 1.19 respectively. In further analysis, the analysis of sensing performance of graphene on Au SPR sensor for ethanol detection was obtained using Finite Difference Time Domain(FDTD) method. With the addition of graphene layers, the sensitivity, detection accuracy and quality factor of the SPR sensor increased at 670 nm.

Publication year: 2020
Authors: Jamil N.A.1, Mei G.S.1, Zain A.R. 1,2, Hewak D. 3, Huang C-C. 3, Mohamed M.A. 1, Majlis B.Y. 1, Menon P.S.1,*
Affiliations:

*1 – Institute of Microengineering and Nanoelectronics (IMEN), Universiti Kebangsaan Malaysia, Bangi, Malaysia
2 – John A.Paulson School of Engineerig and Applied Science, Harvard University, USA
3 – Optoelectronics Research Centre, University of Southampton, UK

Published in: Electron Devices Technology and Manufacturing Conference (EDTM), IEEE
DOI: 10.1109/EDTM47692.2020.9117880

MP-SPR KEYWORDS

CVD ethanol detection graphene refractive index thickness
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